An essential requirement in macro examination of the two faces of wafers is the ability to discard data that is difficult to quantify and to deliver visual data that fully records and highlights the results of sensory testing. These results are a key to detecting defects that can lower yields and for complementing sensory tests during manufacturing of devices.
A further refinement, one indispensable for reducing TCO (Total Cost of Ownership), is the functional ability to detect potential defects hidden in noise. AI-12 delivers a solution offering pre-eminent performance in defect detection and in identifying potential defect, allowing for their early eradication.